In project 3 “Subwavelength & 3D Imaging” of the TTW Persectief Program SYNOPTICS there is an open PhD position in the field of 3D imaging of semiconductor structures using NIR light.
The aim of the PhD project “3D imaging of semiconductor structures” is to detect cracks and damages in semiconductor devices. The challenge is to obtain and analyse images at very high speed and at sufficient lateral and axial resolution. 3D imaging is the holy grale of optical imaging because the image obtained by focusing on particular depths is blurred by out of focus scattered fields.
In the initial stage of the project different 3D imaging methods will be investigated. One of these techniques is optical coherence tomography for which there is already a set-up in Delft.